/dev/nvme0n1 smartctl 7.5 2025-04-30 r5714 [x86_64-linux-6.12.44-3-MANJARO] (local build) Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: WD_BLACK SN850X 4000GB Serial Number: -- Firmware Version: 624361WD PCI Vendor/Subsystem ID: 0x15b7 IEEE OUI Identifier: 0x001b44 Total NVM Capacity: 4,000,787,030,016 [4.00 TB] Unallocated NVM Capacity: 0 Controller ID: 8224 NVMe Version: 1.4 Number of Namespaces: 1 Namespace 1 Size/Capacity: 4,000,787,030,016 [4.00 TB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 001b44 ... Local Time is: Sat Sep 20 19:08:54 2025 CEST Firmware Updates (0x14): 2 Slots, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x00df): Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp Verify Log Page Attributes (0x1e): Cmd_Eff_Lg Ext_Get_Lg Telmtry_Lg Pers_Ev_Lg Maximum Data Transfer Size: 128 Pages Warning Comp. Temp. Threshold: 90 Celsius Critical Comp. Temp. Threshold: 94 Celsius Namespace 1 Features (0x02): NA_Fields Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 9.00W 9.00W - 0 0 0 0 0 0 1 + 6.00W 6.00W - 0 0 0 0 0 0 2 + 4.50W 4.50W - 0 0 0 0 0 0 3 - 0.0250W - - 3 3 3 3 3100 11900 4 - 0.0050W - - 4 4 4 4 3900 45700 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 2 1 - 4096 0 1 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02, NSID 0xffffffff) Critical Warning: 0x00 Temperature: 39 Celsius Available Spare: 100% Available Spare Threshold: 10% Percentage Used: 0% Data Units Read: 5,643,606 [2.88 TB] Data Units Written: 2,437,045 [1.24 TB] Host Read Commands: 38,779,772 Host Write Commands: 15,919,020 Controller Busy Time: 238 Power Cycles: 154 Power On Hours: 41 Unsafe Shutdowns: 10 Media and Data Integrity Errors: 0 Error Information Log Entries: 0 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Error Information (NVMe Log 0x01, 16 of 256 entries) No Errors Logged Self-test Log (NVMe Log 0x06, NSID 0xffffffff) Self-test status: No self-test in progress No Self-tests Logged /dev/sda smartctl 7.5 2025-04-30 r5714 [x86_64-linux-6.12.44-3-MANJARO] (local build) Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: SAMSUNG SSD 830 Series Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: CXM03B1Q User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device TRIM Command: Available Device is: In smartctl database 7.5/5706 ATA Version is: ACS-2 T13/2015-D revision 2 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sat Sep 20 19:08:54 2025 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x83) Offline data collection activity is in a Reserved state. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 1020) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 17) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 097 097 000 - 11553 12 Power_Cycle_Count -O--CK 096 096 000 - 3317 177 Wear_Leveling_Count PO--C- 089 089 000 - 392 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 069 050 000 - 31 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 199 CRC_Error_Count -OSRCK 253 253 000 - 0 235 POR_Recovery_Count -O--C- 099 099 000 - 98 241 Total_LBAs_Written -O--CK 099 099 000 - 6423461865 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x02 GPL,SL R/O 2 Comprehensive SMART error log 0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log 0x06 GPL,SL R/O 1 SMART self-test log 0x07 GPL,SL R/O 2 Extended self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 NCQ Command Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (2 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (2 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 11114 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 49152 R_ERR response for data FIS 0x0003 2 53248 R_ERR response for device-to-host data FIS 0x0004 2 57344 R_ERR response for host-to-device data FIS 0x0005 2 7952 R_ERR response for non-data FIS 0x0006 2 2562 R_ERR response for device-to-host non-data FIS 0x0007 2 4096 R_ERR response for host-to-device non-data FIS 0x0008 2 7952 Device-to-host non-data FIS retries 0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 14807 Device-to-host register FISes sent due to a COMRESET 0x000b 2 6145 CRC errors within host-to-device FIS 0x000d 2 7953 Non-CRC errors within host-to-device FIS 0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC 0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC