/dev/nvme0n1 smartctl 7.5 2025-04-30 r5714 [x86_64-linux-6.12.48-1-MANJARO] (local build) Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: XPG GAMMIX S41 Serial Number: -- Firmware Version: VB411D64 PCI Vendor/Subsystem ID: 0x1cc1 IEEE OUI Identifier: 0x707c18 Controller ID: 1 NVMe Version: 1.3 Number of Namespaces: 1 Namespace 1 Size/Capacity: 256,060,514,304 [256 GB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 707c18 ... Local Time is: Thu Oct 9 19:03:00 2025 -05 Firmware Updates (0x02): 1 Slot Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x0014): DS_Mngmt Sav/Sel_Feat Log Page Attributes (0x02): Cmd_Eff_Lg Maximum Data Transfer Size: 32 Pages Warning Comp. Temp. Threshold: 118 Celsius Critical Comp. Temp. Threshold: 150 Celsius Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 8.00W - - 0 0 0 0 230000 50000 1 + 4.00W - - 1 1 1 1 4000 50000 2 + 3.00W - - 2 2 2 2 4000 250000 3 - 0.0500W - - 3 3 3 3 4000 8000 4 - 0.0080W - - 4 4 4 4 8000 30000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 0 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02, NSID 0xffffffff) Critical Warning: 0x00 Temperature: 36 Celsius Available Spare: 100% Available Spare Threshold: 32% Percentage Used: 0% Data Units Read: 1,085,097 [555 GB] Data Units Written: 2,899,418 [1.48 TB] Host Read Commands: 15,267,913 Host Write Commands: 45,822,299 Controller Busy Time: 0 Power Cycles: 121 Power On Hours: 2,070 Unsafe Shutdowns: 14 Media and Data Integrity Errors: 0 Error Information Log Entries: 0 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Error Information (NVMe Log 0x01, 8 of 8 entries) No Errors Logged Self-test Log (NVMe Log 0x06, NSID 0xffffffff) Self-test status: No self-test in progress No Self-tests Logged /dev/sda smartctl 7.5 2025-04-30 r5714 [x86_64-linux-6.12.48-1-MANJARO] (local build) Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 870 EVO 4TB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: SVT03B6Q User Capacity: 4,000,787,030,016 bytes [4.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database 7.5/5706 ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Thu Oct 9 19:03:00 2025 -05 SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 320) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 099 099 000 - 779 12 Power_Cycle_Count -O--CK 099 099 000 - 42 177 Wear_Leveling_Count PO--C- 099 099 000 - 2 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 074 060 000 - 26 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 199 CRC_Error_Count -OSRCK 100 100 000 - 0 235 POR_Recovery_Count -O--C- 099 099 000 - 8 241 Total_LBAs_Written -O--CK 099 099 000 - 6837492429 252 Added_Bad_Flash_Blk_Ct -O--CK 100 100 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 SL VS 16 Device vendor specific log 0xa5 SL VS 16 Device vendor specific log 0xce SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 256 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 26 Celsius Power Cycle Min/Max Temperature: 22/29 Celsius Lifetime Min/Max Temperature: 23/41 Celsius Specified Max Operating Temperature: 70 Celsius Under/Over Temperature Limit Count: 0/0 SMART Status: 0xc24f (PASSED) SCT Temperature History Version: 2 Temperature Sampling Period: 10 minutes Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (103) Index Estimated Time Temperature Celsius 104 2025-10-08 21:50 25 ****** ... ..( 22 skipped). .. ****** 127 2025-10-09 01:40 25 ****** 0 2025-10-09 01:50 26 ******* ... ..( 57 skipped). .. ******* 58 2025-10-09 11:30 26 ******* 59 2025-10-09 11:40 ? - 60 2025-10-09 11:50 24 ***** 61 2025-10-09 12:00 29 ********** 62 2025-10-09 12:10 26 ******* ... ..( 2 skipped). .. ******* 65 2025-10-09 12:40 26 ******* 66 2025-10-09 12:50 27 ******** 67 2025-10-09 13:00 27 ******** 68 2025-10-09 13:10 26 ******* ... ..( 34 skipped). .. ******* 103 2025-10-09 19:00 26 ******* SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 42 --- Lifetime Power-On Resets 0x01 0x010 4 779 --- Power-on Hours 0x01 0x018 6 6837492429 --- Logical Sectors Written 0x01 0x020 6 71351676 --- Number of Write Commands 0x01 0x028 6 1529414226 --- Logical Sectors Read 0x01 0x030 6 4276473 --- Number of Read Commands 0x01 0x038 6 727000 --- Date and Time TimeStamp 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 5 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 26 --- Current Temperature 0x05 0x020 1 41 --- Highest Temperature 0x05 0x028 1 23 --- Lowest Temperature 0x05 0x058 1 70 --- Specified Maximum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 278 --- Number of Hardware Resets 0x06 0x010 4 0 --- Number of ASR Events 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 11 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 8 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC