Probe #ddf6f57067 of ASUSTek VivoBook E14 E402YA_...

Log: smartctl

/dev/sda smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.14.2-desktop-3omv2590] (OpenMandriva Lx 7.4-1) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: BHT WR202I0064G E70245F5 Serial Number: -- Firmware Version: 450100 User Capacity: 62,537,072,640 bytes [62.5 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device TRIM Command: Available, deterministic Device is: Not in smartctl database ATA Version is: ACS-2, ATA/ATAPI-7 T13/1532D revision 1 SATA Version is: SATA 2.6, 3.0 Gb/s Local Time is: Mon Sep 1 00:00:06 2025 EDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Unavailable Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 1115) seconds. Offline data collection capabilities: (0x1d) SMART execute Offline immediate. No Auto Offline data collection support. Abort Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 18) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 9 Power_On_Hours -O--CK 100 100 000 - 8185 12 Power_Cycle_Count -O--CK 100 100 000 - 3247 173 Unknown_Attribute -O--CK 100 100 000 - 0 188 Command_Timeout -O--CK 100 100 000 - 14798 194 Temperature_Celsius -O---K 100 120 000 - 32 199 UDMA_CRC_Error_Count PO--CK 100 100 000 - 0 241 Total_LBAs_Written -O--CK 100 100 000 - 6362 242 Total_LBAs_Read -O--CK 100 100 000 - 9706 234 Unknown_Attribute -O--CK 100 100 000 - 0 235 Unknown_Attribute -O--CK 100 100 000 - 0 236 Unknown_Attribute -O--CK 100 100 000 - 0 237 Unknown_Attribute -O--CK 100 100 000 - 0 243 Unknown_Attribute -O--CK 100 100 000 - 0 244 Unknown_Attribute -O--CK 100 100 000 - 0 245 Unknown_Attribute -O--CK 100 100 000 - 0 246 Unknown_Attribute -O--CK 100 100 000 - 0 247 Unknown_Attribute -O--CK 100 100 000 - 257 248 Unknown_Attribute -O--CK 100 100 000 - 1 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning Read SMART Log Directory failed: scsi error badly formed scsi parameters ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: scsi error badly formed scsi parameters Read GP Log Directory failed SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 No Errors Logged SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) not supported


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